2010 Systems Symposium

Classified Proceedings *
Available Papers and Presentations

* All items are classified secret. Persons requesting a paper/presentation must possess a secret or higher security clearance. Additional distribution restrictions are noted below.


Unless otherwise noted, presentations only are available for each entry.

You may obtain these items at no cost by contacting
DE2AC@jto.hpc.mil

Classified Distribution C Publications       Classified Distribution D Publications
 
Classified, Distribution C Proceedings
* Distribution authorized to employees of US Government and its contractors who hold a secret or higher security clearance.

Directed Energy Modeling & Simulation Conference Proceedings

Mission Level Modeling and Simulation and Visualization
Using the Navy’s Effectiveness Tool Box (ETB) to Simulate a High Energy Laser(HEL) Engagement with an Unmanned Aerial Vehicle

Employment of DE Weapons Conference Proceedings

Applications
Sensor Optimization for Remote Laser Tagging Tracking

HEL Lethality Conference Proceedings

Component Response
Susceptibility of a FMA Antenna to 1.07 Micron Laser Irradiation (Paper only)

System/Subsystem Test
Experimental Testing of High Explosive Targets to Examine the Effects of Laser Spot Size, Position, and Angle (Paper only)


Classified, Distribution D Proceedings
* Distribution authorized to employees of the DoD and its contractors who hold a secret or higher security clearance.

DE Effects Mitigation Conference Proceedings

Mitigation Requirements
US Army Laser Hardening Standard

DE Effects Mitigation - Tactical
Laser Damage and Protection Measurements on Short Wave Infrared Sensors for Nanosecond and Longer Duration Pulses

DE Effects Mitigation - Strategy
Design For Hardening - Spacecraft Structural Hardening

Directed Energy Modeling & Simulation Conference Proceedings

Mission Level Modeling and Simulation and Visualization
CHAMP Military Utility Study Process

HEL Lethality Conference Proceedings

Component Response
Single-Shot and Multiple-Shot Damage Thresholds of InSb Focal Plane Array at 4 micron (Paper only)

Test Facilities, Instrumentation, Diagnostics and Technology
Development of a High Accuracy Gonioreflectometer For Measurement of the Reflectivity of Targets of HEL Weapon Systems (Paper only)

 
Copyright 2017 Directed Energy Professional Society   DHTML/JavaScript Menus by OpenCube

Last updated: 17 August 2017